Design for testability strategies for mixed signal & analogue designs-from layout to system

Author

Richardson, Andrew ; Lechner, A. ; Olbrich, Thomas

Author_Institution

Microelectron. Res. Group, Lancaster Univ., UK

Volume

2

fYear

1998

fDate

1998

Firstpage

425

Abstract

The cost and complexity of mixed signal and analogue production test programs is lending to considerable interest in Design for testability (DfT) techniques that have the potential to improve testability by reducing implementation cost and improving outgoing quality. These techniques range from rules and guidelines for schematic and physical design to full built-in-self-test (BIST) solutions. This paper presents a summary of a number of possible DfT approaches that may well help to solve test cost and test quality difficulties for analogue and mixed signal integrated circuits

Keywords

analogue integrated circuits; automatic testing; built-in self test; design for testability; integrated circuit design; integrated circuit testing; mixed analogue-digital integrated circuits; production testing; BIST; DFT strategies; analogue designs; built-in-self-test; design for testability strategies; integrated circuits; mixed signal designs; production test; Built-in self-test; CMOS technology; Circuit faults; Circuit testing; Cost function; Design for testability; Electronic equipment testing; Guidelines; Signal design; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics, Circuits and Systems, 1998 IEEE International Conference on

Conference_Location

Lisboa

Print_ISBN

0-7803-5008-1

Type

conf

DOI

10.1109/ICECS.1998.814914

Filename

814914