DocumentCode
345601
Title
SCALPEL: projection electron beam lithography
Author
Harriott, L.R.
Author_Institution
Bell Labs., Lucent Technol., Murray Hill, NJ, USA
Volume
1
fYear
1999
fDate
1999
Firstpage
595
Abstract
Even though virtually all integrated circuits over the past 30 years have been made using optical lithography, the limits of its usefulness are on the horizon. From the point of view of the physics of the image formation process, it is difficult to imagine practical processes operating at feature sizes at or near half the wavelength of the exposure system. The exposure wavelength trend has been to tend to ever smaller ultraviolet wavelengths but at a pace slower than the feature size trend for integrated circuits. Therefore, both the imaging mechanisms and industry timing indicate that a new disruptive lithography technology will be needed sometime after about 2003. We have developed SCALPEL electron beam lithography to the point where the basic functionality has been shown. Our efforts over the next few years will be to develop the exposure tool, mask and resist technology to the point of commercial introduction consistent with that timing. Ultimately, relative costs of lithography alternatives will determine the successor to current optical technology. The projections are that SCALPEL will operate at a significant cost advantage to sub-wavelength optical technology and other contenders for next generation lithography. Therefore, we feel that SCALPEL is likely to be the industry choice for 100 nm era circuits and beyond
Keywords
electron beam lithography; integrated circuit technology; SCALPEL electron beam lithography; SCALPEL projection electron beam lithography; basic functionality; disruptive lithography technology; image formation process; imaging mechanisms; next generation lithography; resist technology; sub-wavelength optical technology; ultraviolet wavelengths; Costs; Electron beams; Electron optics; Integrated circuit technology; Integrated optics; Lithography; Optical imaging; Photonic integrated circuits; Physics; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Particle Accelerator Conference, 1999. Proceedings of the 1999
Conference_Location
New York, NY
Print_ISBN
0-7803-5573-3
Type
conf
DOI
10.1109/PAC.1999.795770
Filename
795770
Link To Document