DocumentCode :
3456114
Title :
Development of integrated vibratory-gyroscopes based on photonic bandgap materials
Author :
Trigona, C. ; Ando, B. ; Baglio, S.
Author_Institution :
D.I.E.E.I., Dept. of Electr., Electron. & Informatic Eng., Univ. of Catania, Catania, Italy
fYear :
2015
fDate :
4-5 June 2015
Firstpage :
114
Lastpage :
117
Abstract :
This work focuses on a Micro-Opto-Electro-Mechanical (MOEM) vibratory gyroscope which operates in resonant condition. A custom technology performed through the adoption of a Silicon On Insulator (SOI) substrate has been considered for the development of the inertial sensor. The optical readout has been realized by using metal dielectric multilayer photonic band gap materials (PBGs). This optical structure, composed of alternating layers of one metal and one dielectric material, has been deposited on the surface of the micromachined device obtaining reflection properties function of the displacement of the proof mass induced by an external angular velocity. Theoretical and experimental investigations of metal-dielectric one dimensional PBG structures applied in a SOI-MOEM prototype have been performed, showing the improvement of the proposed approach with respect to the classical strategies.
Keywords :
dielectric materials; elemental semiconductors; gyroscopes; light reflection; micro-optomechanical devices; micromachining; micromechanical resonators; microsensors; optical multilayers; optical sensors; photonic band gap; silicon; silicon-on-insulator; vibration measurement; PBG structure; SOI substrate; Si; external angular velocity; inertial sensor; integrated MOEM vibratory gyroscope; integrated microoptoelectromechanical vibratory gyroscope; metal dielectric multilayer photonic band gap material; micromachined device; optical readout; proof mass displacement; reflection property; silicon on insulator substrate; Gyroscopes; Metals; Optical device fabrication; Optical reflection; Optical resonators; Optical sensors; Silicon; Integrated gyroscope; MOEMS; PBG structures; SOI technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Metrology for Aerospace (MetroAeroSpace), 2015 IEEE
Conference_Location :
Benevento
Type :
conf
DOI :
10.1109/MetroAeroSpace.2015.7180637
Filename :
7180637
Link To Document :
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