Title :
Probing mechanical, electrical and thermal properties of nanoscale materials using MEMS devices
Author :
Alam, Mohammad Tawhidul ; Haque, Mohammad Ariful
Author_Institution :
Mech. & Nucl. Eng., Pennsylvania State Univ., University Park, PA, USA
Abstract :
While the current trend in nanoscale materials characterization is to investigate single domain (mechanical, electrical, thermal) properties, this study explore if the extremely small size also `couples´ these domains. However, even single domain studies are challenging at the nanoscale and the literature suggests the need for new multi-domain characterization techniques. In this paper, we present experimental design for performing nanoscale multi-physics characterizations. Demonstrative results on the role of mechanical strain on the thermal and electrical conductivity of metals, semiconductors and insulators are also presented.
Keywords :
electrical conductivity; insulators; micromechanical devices; nanostructured materials; thermal conductivity; MEMS device; electrical conductivity; electrical property; insulator; mechanical strain property; metal; multidomain characterization technique; nanoscale material characterization; nanoscale multiphysics characterization; semiconductor; thermal conductivity; thermal property; Conductivity; Couplings; Materials; Nanoscale devices; Phonons; Strain; Thermal conductivity; MEMS; Nanoscale multi-physics; Thin films; phase transformation; thermal and electrical conductivity;
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS & EUROSENSORS XXVII), 2013 Transducers & Eurosensors XXVII: The 17th International Conference on
Conference_Location :
Barcelona
DOI :
10.1109/Transducers.2013.6626882