• DocumentCode
    3456216
  • Title

    Cd1-xZnxTe gamma ray detectors

  • Author

    Butler, J.F. ; Lingren, C.L. ; Doty, F.P.

  • Author_Institution
    Aurora Technologies Corp., San Diego, CA, USA
  • fYear
    1991
  • fDate
    2-9 Nov. 1991
  • Firstpage
    129
  • Abstract
    Results of an effort to improve the performance of CdTe detectors by addressing starting element purity and crystallinity are described. Structural perfection was improved by alloying with ZnTe to form crystals of Cd/sub 1-x/Zn/sub x/Te. Crystals were grown by a high-pressure Bridgman method. Evidence for significant enhancements of the mu tau products resulting from these efforts is presented. Features of Cd/sub 0.8/Zn/sub 0.2/Te detectors include energy resolutions at 122 keV <7%, a resistivity of approximately 10/sup 11/ Omega -cm, no polarization effects, and temperatures for useful operation up to 100 degrees C. The large sizes (e.g., 3 kg, 7.5-cm diameter) and excellent homogeneity of the crystals make it possible to produce detectors and imaging arrays with areas of several square inches.<>
  • Keywords
    II-VI semiconductors; gamma-ray detection and measurement; semiconductor counters; 100 degC; 122 keV; 3 kg; 7.5 cm; Cd/sub 1-x/Zn/sub x/Te gamma ray detectors; crystallinity; energy resolutions; high-pressure Bridgman method; imaging arrays; mv tau products; purity; resistivity; Alloying; Conductivity; Crystallization; Crystals; Detectors; Energy resolution; Polarization; Tellurium; Temperature; Zinc compounds;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference, 1991., Conference Record of the 1991 IEEE
  • Conference_Location
    Santa Fe, NM, USA
  • Print_ISBN
    0-7803-0513-2
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1991.258906
  • Filename
    258906