Title :
Fabrication of multi-layer vertically stacked fused silica microsystems
Author :
Cao, Zhichao ; Yuan, Yuan ; He, Guangjun ; Peterson, Rebecca L. ; Najafi, Khalil
Author_Institution :
Center for Wireless Integrated MicroSensing & Syst. (WIMS), Univ. of Michigan, Ann Arbor, MI, USA
Abstract :
In this paper, we present a fabrication process for an extremely compact, multi-layer, vertically-stacked fused silica microsystem. The system contains six fused silica layers in a total volume of less than 13 mm3. In the package are seven capacitive sensors designed as a six-degree of freedom inertial measurement unit plus a resonant timing device. Sixty-eight vertical electrical feedthroughs run through all six layers. Three key technologies are introduced: the fabrication of electrostatic devices on fused silica, the creation of through wafer vias in multiple layers of fused silica and stack bonding for 3-D integration of fused silica devices. The presented fused silica technology can be used for extreme miniaturization and integration of many future MEMS microsystems.
Keywords :
capacitive sensors; electrostatic devices; inertial systems; measurement systems; microfabrication; microsensors; silicon compounds; three-dimensional integrated circuits; timing; wafer bonding; wafer level packaging; 3D fused silica device integration; MEMS microsystem; SiO2; capacitive sensor; degree of freedom; electrostatic device; inertial measurement unit; multilayer vertically stacked fused silica microsystem fabrication; resonant timing device; stack bonding; through wafer packaging; Bonding; Gold; Micromechanical devices; Sensors; Silicon compounds; Three-dimensional integration; fused silica; inertial sensors; microsystem; through wafer via;
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS & EUROSENSORS XXVII), 2013 Transducers & Eurosensors XXVII: The 17th International Conference on
Conference_Location :
Barcelona
DOI :
10.1109/Transducers.2013.6626890