Takeda, S. ; Ishino, K. ; Inoue, Y. ; Tshida, A. ; Fujiyasu, H. ; Kominami, H. ; Mimura, H. ; Nakanishi, Y. ; Sakakibara, S.
fYear :
2004
fDate :
Oct. 27-29, 2004
Firstpage :
332
Lastpage :
333
Keywords :
Electron beams; Electron optics; Gallium nitride; Nanostructures; Optical microscopy; Phosphors; Scanning electron microscopy; Substrates; Temperature; Transmission electron microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocesses and Nanotechnology Conference, 2004. Digest of Papers. 2004 International
