• DocumentCode
    3456595
  • Title

    Research results of the radio-frequency characteristics of microwave devices

  • Author

    Krutov, A.V. ; Mitlin, V.A. ; Rebrov, A.S.

  • Author_Institution
    SRPC Istok, Russia
  • fYear
    1999
  • fDate
    13-16 Sept. 1999
  • Firstpage
    66
  • Lastpage
    68
  • Abstract
    In this paper the research results of the radio-frequency characteristics of microwave devices are presented. The calculations were conducted with the application of a nonlinear physical-based model of a GaAs field-effect transistor with a Schottky barrier (MESFET). The comparative characteristics for the simulation analysis were extracted from measured S-parameters (Materka model), and the nonlinear physical model based on the analysis of the parameters of the semiconductor structure and the geometrical dimensions of the electrodes of the transistor, is deduced. Linear (gain, input/output VSWR) and nonlinear (output power, intermodulation distortion) parameters of a power amplifier are surveyed. The good coincidence of calculated and measured parameters is shown.
  • Keywords
    III-V semiconductors; S-parameters; Schottky gate field effect transistors; equivalent circuits; gallium arsenide; microwave field effect transistors; semiconductor device models; GaAs; GaAs MESFET; IMD; Materka model; RF characteristics; field-effect transistor; input/output VSWR; intermodulation distortion; linear parameters; measured S-parameters; microwave devices; nonlinear parameters; nonlinear physical model; output power; power amplifier; radiofrequency characteristics; Analytical models; Distortion measurement; FETs; Gallium arsenide; MESFETs; Microwave devices; Power amplifiers; Radio frequency; Schottky barriers; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1999. Microwave & Telecommunication Technology. 1999 9th International Crimean [In Russian with English abstracts]
  • Conference_Location
    Sevastopol, Crimea, Ukraine
  • Print_ISBN
    966-572-003-1
  • Type

    conf

  • DOI
    10.1109/CRMICO.1999.815146
  • Filename
    815146