• DocumentCode
    3456617
  • Title

    Physics-topological design of GaAs field-effect transistors with a Schottky barrier

  • Author

    Krutov, A.V. ; Mitlin, V.A. ; Rebrov, A.S.

  • Author_Institution
    SRPC Istok, Russia
  • fYear
    1999
  • fDate
    13-16 Sept. 1999
  • Firstpage
    69
  • Lastpage
    71
  • Abstract
    In this paper the results of physics-topological design of GaAs field-effect transistors with a Schottky barrier (MESFET) are presented. A linear process and physics-based MESFET model were used for the design. A distinctive feature of the model is that the output parameters of the designed device can be forecast before its manufacture and measurement of the microwave parameters. The questions concerning the influence of the fundamental technological factors are surveyed: channel doping density and electron mobilities; the geometrical dimensions of the transistor; gate lengths, fingers width and quantity. The parameters of the MESFET equivalent circuit and maximum available gain of the transistor in a frequency band are deduced. The good coincidence of calculated and measured parameters is shown.
  • Keywords
    III-V semiconductors; Schottky gate field effect transistors; equivalent circuits; gallium arsenide; microwave field effect transistors; semiconductor device models; GaAs; MESFET equivalent circuit; channel doping density; electron mobilities; gate length; geometrical dimensions; maximum available gain; microwave parameters; physical-topological design; physics-based MESFET model; FETs; Gallium arsenide; MESFETs; Microwave devices; Microwave measurements; Microwave transistors; Predictive models; Schottky barriers; Semiconductor process modeling; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1999. Microwave & Telecommunication Technology. 1999 9th International Crimean [In Russian with English abstracts]
  • Conference_Location
    Sevastopol, Crimea, Ukraine
  • Print_ISBN
    966-572-003-1
  • Type

    conf

  • DOI
    10.1109/CRMICO.1999.815147
  • Filename
    815147