DocumentCode
3456617
Title
Physics-topological design of GaAs field-effect transistors with a Schottky barrier
Author
Krutov, A.V. ; Mitlin, V.A. ; Rebrov, A.S.
Author_Institution
SRPC Istok, Russia
fYear
1999
fDate
13-16 Sept. 1999
Firstpage
69
Lastpage
71
Abstract
In this paper the results of physics-topological design of GaAs field-effect transistors with a Schottky barrier (MESFET) are presented. A linear process and physics-based MESFET model were used for the design. A distinctive feature of the model is that the output parameters of the designed device can be forecast before its manufacture and measurement of the microwave parameters. The questions concerning the influence of the fundamental technological factors are surveyed: channel doping density and electron mobilities; the geometrical dimensions of the transistor; gate lengths, fingers width and quantity. The parameters of the MESFET equivalent circuit and maximum available gain of the transistor in a frequency band are deduced. The good coincidence of calculated and measured parameters is shown.
Keywords
III-V semiconductors; Schottky gate field effect transistors; equivalent circuits; gallium arsenide; microwave field effect transistors; semiconductor device models; GaAs; MESFET equivalent circuit; channel doping density; electron mobilities; gate length; geometrical dimensions; maximum available gain; microwave parameters; physical-topological design; physics-based MESFET model; FETs; Gallium arsenide; MESFETs; Microwave devices; Microwave measurements; Microwave transistors; Predictive models; Schottky barriers; Semiconductor process modeling; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1999. Microwave & Telecommunication Technology. 1999 9th International Crimean [In Russian with English abstracts]
Conference_Location
Sevastopol, Crimea, Ukraine
Print_ISBN
966-572-003-1
Type
conf
DOI
10.1109/CRMICO.1999.815147
Filename
815147
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