• DocumentCode
    3456908
  • Title

    Research on Calculation of Sobolev Active Contour Model

  • Author

    Chen, Guohua

  • Author_Institution
    Sch. of Med-Info Eng., Guangdong Pharm. Univ., Guangzhou, China
  • fYear
    2010
  • fDate
    21-23 Oct. 2010
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    During the last decade, Active Contour Models had been greatly developed and were used in image edge detection, image segmentation and classification, image registration, 3D reconstruction and many other areas. In the meantime, Active Contour Models themselves had also been enriched and completed. Various typed Active Contour Models had emerged, such as Sobolev Active Contour Model(SACM). SACM was considered as a global model and showed great promise in application. It out-performs the traditional model for the same energy in many cases. SACM is a new model, so there are few cases of its application was reported. But it was believed that SACM will be a very important tool for image segmentation. SACM covers vast areas of study such as Soloblev space, Steepest decent methods, Variation of functionals, Riesz representing theorem, Riemannian geometry, PDE, and Image procession. This paper tries to clarify the relationships among those different areas of studies. Especially, the paper had introduced new formulae for the calculation of Soloblev gradients, because the formulae initiated by Sundaramoorthi are not strict mathematically.
  • Keywords
    computational geometry; computer vision; functional analysis; gradient methods; image segmentation; variational techniques; 3D image reconstruction; PDE; Riemannian geometry; Riesz representing theorem; Sobolev active contour model; Soloblev gradient; image classification; image edge detection; image procession; image registration; image segmentation; steepest decent method; Active contours; Geometry; Image edge detection; Image registration; Image segmentation; Solid modeling; Three dimensional displays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (CCPR), 2010 Chinese Conference on
  • Conference_Location
    Chongqing
  • Print_ISBN
    978-1-4244-7209-3
  • Electronic_ISBN
    978-1-4244-7210-9
  • Type

    conf

  • DOI
    10.1109/CCPR.2010.5659189
  • Filename
    5659189