Title :
The Effect of AM Noise on Correlation Phase Noise Measurements
Author :
Rubiola, Enrico ; Boudot, Rodolphe
Author_Institution :
Univ. de Franche Comte, Paris
fDate :
May 29 2007-June 1 2007
Abstract :
We analyze the phase-noise measurement methods in which correlation and averaging is used to reject the background noise of the instrument. All the known methods make use of a mixer, used either as a saturated phase detector or as a linear synchronous detector. Unfortunately, AM noise is taken in through the power-to-DC-offset conversion mechanism that results from the mixer asymmetry. The measurement of some mixers indicates that the unwanted amplitude-to-voltage gain is of the order of 5-50 mV, which is 12-35 dB lower than the phase-to-voltage gain of the mixer. In addition, the trick of setting the mixer at a sweet point - off the quadrature condition - where the sensitivity to AM nulls, works only with microwave mixers. The HF-VHF mixers have not this sweet point. Moreover, we prove that if the AM noise comes from the oscillator under test, it can not be rejected by correlation. At least not with the schemes currently used. An example shows that at some critical frequencies the unwanted effect of AM noise is of the same order - if not greater - than the phase noise. Thus, experimental mistakes are around the corner. This article is the conference version of an article published in the IEEE Transact. UFFC vol. 54 no. 5 pp. 926-932, May 2007.
Keywords :
VHF oscillators; correlation methods; microwave mixers; microwave oscillators; noise measurement; phase detectors; AM noise; HF-VHF mixers; correlation phase noise measurements; linear synchronous detector; microwave mixers; oscillator; power-to-DC-offset conversion; saturated phase detector; sensitivity; Background noise; Detectors; Gain measurement; Instruments; Microwave oscillators; Noise measurement; Phase detection; Phase measurement; Phase noise; Testing;
Conference_Titel :
Frequency Control Symposium, 2007 Joint with the 21st European Frequency and Time Forum. IEEE International
Conference_Location :
Geneva
Print_ISBN :
978-1-4244-0646-3
Electronic_ISBN :
1075-6787
DOI :
10.1109/FREQ.2007.4319249