Title :
Shape-based defect classification for non destructive testing
Author :
D´Angelo, Gianni ; Rampone, Salvatore
Author_Institution :
Dept. of Sci. & Technol., Univ. of Sannio, Benevento, Italy
Abstract :
The aim of this work is to classify the aerospace structure defects detected by eddy current non-destructive testing. The proposed method is based on the assumption that the defect is bound to the reaction of the probe coil impedance during the test. Impedance plane analysis is used to extract a feature vector from the shape of the coil impedance in the complex plane, through the use of some geometric parameters. Shape recognition is tested with three different machine-learning based classifiers: decision trees, neural networks and Naive Bayes. The performance of the proposed detection system are measured in terms of accuracy, sensitivity, specificity, precision and Matthews correlation coefficient. Several experiments are performed on dataset of eddy current signal samples for aircraft structures. The obtained results demonstrate the usefulness of our approach and the competiveness against existing descriptors.
Keywords :
Bayes methods; aerospace computing; aircraft testing; decision trees; eddy current testing; feature extraction; image classification; learning (artificial intelligence); neural nets; shape recognition; Matthews correlation coefficient; Naive Bayes; aerospace structure defects; aircraft structures; decision trees; detection system; eddy current nondestructive testing; eddy current signal sample dataset; feature vector extraction; geometric parameters; impedance plane analysis; machine-learning based classifiers; neural networks; probe coil impedance reaction; shape recognition; shape-based defect classification; Conferences; Eddy currents; Feature extraction; Image retrieval; Impedance; Shape; Testing; Non-destructive testing (NDT); content-based image retrieval (CBIR); eddy current testing (ECT); learning algorithm; shape geometric descriptor (SGD); signature-based classifier;
Conference_Titel :
Metrology for Aerospace (MetroAeroSpace), 2015 IEEE
Conference_Location :
Benevento
DOI :
10.1109/MetroAeroSpace.2015.7180691