DocumentCode
3457348
Title
Learning high-dimensional image statistics for abnormality detection on medical images
Author
Erus, Guray ; Zacharaki, Evangelia I. ; Bryan, Nick ; Davatzikos, Christos
Author_Institution
Dept. of Radiol., Univ. of Pennsylvania, Philadelphia, PA, USA
fYear
2010
fDate
13-18 June 2010
Firstpage
139
Lastpage
145
Abstract
We present a general methodology that aims to learn multi-variate statistics of high dimensional images, in order to capture the inter-individual variability of imaging data from a limited number of training images. The statistical learning procedure is used for identifying abnormalities as deviations from the normal variation. In most practical applications, learning an accurate statistical model of the observed data is a very challenging task due to the very high dimensionality of the images, and the limited number of available training samples. We attempt to overcome this problem by capturing the statistics of a large number of lower dimensional subspaces, which can be estimated more reliably. The subspaces are derived in a multi-scale fashion, and capture image characteristics ranging from fine and localized to coarser and relatively more global. The main premise is that an imaging pattern that is consistent with the statistics of a large number of subspaces, each reflecting a marginal probability density function (pdf), is likely to be consistent with the overall pdf, which hasn´t been explicitly estimated. Abnormalities in a new image are identified as significant deviations from the normal variation captured by the learned subspace models, and are determined via iterative projections on these subspaces.
Keywords
iterative methods; medical image processing; probability; statistical analysis; abnormality detection; high dimensional image statistics; iterative projections; medical images; multivariate statistics; probability density function; statistical learning procedure; Anatomy; Biomedical imaging; Image analysis; Pathology; Principal component analysis; Shape; Statistical analysis; Statistics; Supervised learning; Training data;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition Workshops (CVPRW), 2010 IEEE Computer Society Conference on
Conference_Location
San Francisco, CA
ISSN
2160-7508
Print_ISBN
978-1-4244-7029-7
Type
conf
DOI
10.1109/CVPRW.2010.5543141
Filename
5543141
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