• DocumentCode
    3457584
  • Title

    Determination of the limiting factors in the absolute phase noise of an L-band dielectric resonator oscillator

  • Author

    Mizan, M. ; McGowan, R.C. ; Lukaszek, T. ; Ballato, A.

  • Author_Institution
    US Army Labcom, Fort Monmouth, NJ, USA
  • fYear
    1991
  • fDate
    29-31 May 1991
  • Firstpage
    687
  • Lastpage
    692
  • Abstract
    In an attempt to better understand the noise performance of a state-of-the-art two-stage L-band dielectric resonator oscillator (DRO), a single-stage DRO was constructed for comparison. The results of this investigation are presented. The discussion begins with a brief analysis of the design and temperature performance of the one- and two-stage DROs. The residual and absolute phase noise performance are discussed. The measured data demonstrate the low phase noise capability and excellent frequency stability of the two-stage, 2-GHz DRO
  • Keywords
    dielectric resonators; frequency stability; microwave oscillators; noise; 2 GHz; L-band; UHF; absolute phase noise; dielectric resonator oscillator; frequency stability; noise performance; single-stage DRO; temperature performance; two-stage; Additive noise; Bandwidth; Circuit noise; Dielectric loss measurement; Dielectric losses; Frequency; L-band; Noise measurement; Oscillators; Phase noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control, 1991., Proceedings of the 45th Annual Symposium on
  • Conference_Location
    Los Angeles, CA
  • Print_ISBN
    0-87942-658-6
  • Type

    conf

  • DOI
    10.1109/FREQ.1991.145968
  • Filename
    145968