• DocumentCode
    3458117
  • Title

    Fabrication of silicon strip detectors using a step-and-repeat lithography system

  • Author

    Holland, S.

  • Author_Institution
    Lawrence Berkeley Lab., California Univ., CA, USA
  • fYear
    1991
  • fDate
    2-9 Nov. 1991
  • Firstpage
    251
  • Abstract
    The author describes the use of a step-and-repeat lithography system (stepper) for the fabrication of silicon strip detectors. Although the field size of the stepper is only 20 mm in diameter, much larger detectors have been fabricated by printing a repetitive strip detector pattern in a step-and-repeat fashion. The basic unit cell is 7 mm in length. The stepper employs a laser interferometer for stage placement, and the resulting high precision allows one to accurately place the repetitive patterns on the wafer. A small overlap between the patterns ensures a continuous strip. A detector consisting of 512 strips on a 50 mu m pitch has been fabricated using this technique. The dimensions of the detector are 6.3 cm by 2.56 cm. Yields of over 99% have been achieved, where yield is defined as the percentage of strips with reverse leakage current below 1 nA.<>
  • Keywords
    photolithography; position sensitive particle detectors; semiconductor counters; semiconductor device manufacture; silicon; 2.56 cm; 20 mm; 50 micron; 6.3 cm; 7 mm; Si; Si strip detectors; fabrication; laser interferometer; microstrip detectors; repetitive strip detector pattern; stage placement; step-and-repeat lithography system; Detectors; Geometry; Laboratories; Leakage current; Lenses; Lithography; Optical device fabrication; Printing; Silicon; Strips;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference, 1991., Conference Record of the 1991 IEEE
  • Conference_Location
    Santa Fe, NM, USA
  • Print_ISBN
    0-7803-0513-2
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1991.258982
  • Filename
    258982