Title :
Microcavity threshold reduction in an external-cavity surface-emitting laser
Author :
Sandusky, J.V. ; Brueck, Steven R. J.
Author_Institution :
Center for High Technology Materials, University of New Mexico
Keywords :
Cameras; Microcavities; Optical pulses; Semiconductor lasers; Spatial resolution; Spatiotemporal phenomena; Stimulated emission; Surface emitting lasers; Turning; Vertical cavity surface emitting lasers;
Conference_Titel :
Lasers and Electro-Optics, 1997. CLEO '97., Summaries of Papers Presented at the Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-4125-2
DOI :
10.1109/CLEO.1997.603070
