• DocumentCode
    3458149
  • Title

    Elastic Modulus of Nanometer Silicon Membrane

  • Author

    Bao, Fang ; Yu, Hong ; Huang, Qing-An

  • Author_Institution
    Key Lab. of MEMS of the Minist. of Educ., Southeast Univ., Nanjing
  • fYear
    2006
  • fDate
    20-23 Aug. 2006
  • Firstpage
    85
  • Lastpage
    90
  • Abstract
    In this article, a new method is presented to calculate the in-plane elastic modulus of nanometer silicon membrane. In comparing with the traditional model, it accounts for the discrete nature in the thickness direction of the silicon membrane. In this model, interatomic bonding forces are equivalent to spring forces. A method to obtain the spring constant k is also presented by using lattice dynamics theory. Investigating the obtained in-plane elastic modulus value, it is found that the value is highly dependent on the thickness of the membrane and approaches the bulk value as the thickness increases.
  • Keywords
    elastic moduli measurement; lattice dynamics; membranes; nanostructured materials; silicon; Si; discrete natured thickness direction; in-plane elastic modulus calculation; interatomic bonding forces; lattice dynamics theory; nanometer silicon membrane; spring constant; spring forces; Atomic layer deposition; Biomembranes; Bonding forces; Joining processes; Laboratories; Lattices; Micromechanical devices; Nanomaterials; Silicon; Springs; elastic modulus; membrane; semicontinuum;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Acquisition, 2006 IEEE International Conference on
  • Conference_Location
    Shandong
  • Print_ISBN
    1-4244-0528-9
  • Electronic_ISBN
    1-4244-0529-7
  • Type

    conf

  • DOI
    10.1109/ICIA.2006.305857
  • Filename
    4097790