DocumentCode
3458149
Title
Elastic Modulus of Nanometer Silicon Membrane
Author
Bao, Fang ; Yu, Hong ; Huang, Qing-An
Author_Institution
Key Lab. of MEMS of the Minist. of Educ., Southeast Univ., Nanjing
fYear
2006
fDate
20-23 Aug. 2006
Firstpage
85
Lastpage
90
Abstract
In this article, a new method is presented to calculate the in-plane elastic modulus of nanometer silicon membrane. In comparing with the traditional model, it accounts for the discrete nature in the thickness direction of the silicon membrane. In this model, interatomic bonding forces are equivalent to spring forces. A method to obtain the spring constant k is also presented by using lattice dynamics theory. Investigating the obtained in-plane elastic modulus value, it is found that the value is highly dependent on the thickness of the membrane and approaches the bulk value as the thickness increases.
Keywords
elastic moduli measurement; lattice dynamics; membranes; nanostructured materials; silicon; Si; discrete natured thickness direction; in-plane elastic modulus calculation; interatomic bonding forces; lattice dynamics theory; nanometer silicon membrane; spring constant; spring forces; Atomic layer deposition; Biomembranes; Bonding forces; Joining processes; Laboratories; Lattices; Micromechanical devices; Nanomaterials; Silicon; Springs; elastic modulus; membrane; semicontinuum;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Acquisition, 2006 IEEE International Conference on
Conference_Location
Shandong
Print_ISBN
1-4244-0528-9
Electronic_ISBN
1-4244-0529-7
Type
conf
DOI
10.1109/ICIA.2006.305857
Filename
4097790
Link To Document