DocumentCode :
3458246
Title :
A New Connectivity-Based Cluster Validity Index
Author :
Zhang, Shangchao ; Yu, Jian
Author_Institution :
Sch. of Comput. & Inf. Technol., Beijing Jiaotong Univ., Beijing, China
fYear :
2010
fDate :
21-23 Oct. 2010
Firstpage :
1
Lastpage :
6
Abstract :
Many cluster validity indices faced two problems. First, most of them neglect the variance of intra-cluster compactness between clusters. Second, some indices can not deal well with the clusters of arbitrary shapes. In this paper, we propose a new approach to solving these two problems: we define the validity indices for the whole clustering results upon the validity indices of single clusters. This idea can help indices deal with clusters of different intra-cluster compactness. After that, we take advantage of connect distance and propose a new connectivity-based cluster validity index which can deal with the clusters of arbitrary shapes. The experiment results show its effectiveness.
Keywords :
pattern clustering; statistical analysis; cluster analysis; connectivity-based cluster validity index; intra-cluster compactness; Electronic mail; Indexes; Information processing; Iris recognition; Pattern analysis; Pattern recognition; Shape;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition (CCPR), 2010 Chinese Conference on
Conference_Location :
Chongqing
Print_ISBN :
978-1-4244-7209-3
Electronic_ISBN :
978-1-4244-7210-9
Type :
conf
DOI :
10.1109/CCPR.2010.5659259
Filename :
5659259
Link To Document :
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