DocumentCode :
3458265
Title :
Simulation of the single-electron transistors based on different materials
Author :
Abramov, I.I. ; Novik, E.G.
Author_Institution :
Byelorussian State Univ. of Inf. & Radioelectron., Minsk, Byelorussia
fYear :
1999
fDate :
13-16 Sept. 1999
Firstpage :
292
Lastpage :
295
Abstract :
The theoretical investigation of the constructive-technological and electrophysical parameters influencing the single-electron transistor characteristics (temperature of operation, frequency limit, current-voltage characteristic) is carried out. The single-electron device simulator SET-NANODEV was used for the investigations. The single-electron transistors based on different metals were considered. Behavior of the single-electron transistor characteristics depending on material and construction parameters was determined.
Keywords :
semiconductor device models; single electron transistors; SET-NANODEV; construction parameters; current-voltage characteristic; electrophysical parameters; frequency limit; operation temperature; single-electron transistors; Ambient intelligence; Artificial intelligence; Chromium; Gold; Helium; IEEE catalog; Message-oriented middleware; Niobium compounds; Pulse width modulation; Single electron transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 1999. Microwave & Telecommunication Technology. 1999 9th International Crimean [In Russian with English abstracts]
Conference_Location :
Sevastopol, Crimea, Ukraine
Print_ISBN :
966-572-003-1
Type :
conf
DOI :
10.1109/CRMICO.1999.815242
Filename :
815242
Link To Document :
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