Development of a monolithic constant fraction discriminator

Author

Tanaka, Manobu ; Ikeda, Hirokazu ; Ikeda, Mitsuo ; Inaba, Susumu

Author_Institution

Nat. Lab. for High Energy Phys., Ibaraki, Japan

fYear

1991

fDate

2-9 Nov. 1991

Firstpage

611

Abstract

A constant fraction (CF) discriminator was developed with a bipolar application-specific integrated circuit (ASIC) technology from NEC. Prototype chips were examined for their integrity and performance. It is concluded that this technology has significant advantages over others in use for applications in high-density integration, and particularly for some large-scale experiments such as the B-factory and the Superconducting Super Collider (SSC). The performance of this differentiated CF integrated circuit was tested. The function of the differentiation CF discriminator (DCFD) IC was exactly what was expected, and the full width of the time walk was 1 ns or less.<>

Keywords

application specific integrated circuits; discriminators; nuclear electronics; ASIC; B-factory; DCFD; NEC; SSC; Superconducting Super Collider; bipolar application-specific integrated circuit; differentiated CF integrated circuit; differentiation CF discriminator; full width; high-density integration; integrity; large-scale experiments; monolithic constant fraction discriminator; performance; prototype chips; time walk; Analog integrated circuits; Attenuators; Bipolar integrated circuits; Computational fluid dynamics; Delay; Laboratories; National electric code; Prototypes; Timing; Wideband;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium and Medical Imaging Conference, 1991., Conference Record of the 1991 IEEE

Conference_Location

Santa Fe, NM, USA

Print_ISBN

0-7803-0513-2

Type

conf

DOI

10.1109/NSSMIC.1991.259010

Filename

259010