• DocumentCode
    3458326
  • Title

    Piezoceramics for high frequency (50 to 100 MHz) single element imaging transducers

  • Author

    Zipparo, Michael J. ; Shung, K. Kirk ; Shrout, Thomas R.

  • Author_Institution
    Bioeng. Program, Pennsylvania State Univ., University Park, PA, USA
  • Volume
    2
  • fYear
    1996
  • fDate
    3-6 Nov 1996
  • Firstpage
    929
  • Abstract
    The properties of transducer materials operating at high frequencies determine the level of performance which is achievable. Selection of the appropriate material can be made based on the transducer size and frequency. The properties of a number of piezoceramic materials have been experimentally determined by measuring the electrical impedance of air-loaded resonators whose thickness corresponds to resonance frequencies from 10 to 100 MHz. Materials measured include commercially available high dielectric lead zirconate titanate (PZT) and lower dielectric modified lead titanate (PT) ceramics, as well as materials which have been designed or modified to result in improved properties at high frequencies. Conclusions regarding the influence of the microstructure and composition on the frequency dependence of the properties are made based on the calculations and microstructural analysis of each material. Issues which affect transducer performance are discussed in relation to the measured properties. For larger area transducers the use of a lower dielectric constant material results in better electrical matching between the transducer and standard 50 Ω electronics. KLM model simulations show improved performance for transducers which are electrically matched
  • Keywords
    acoustic materials; acoustic transducers; lead compounds; piezoceramics; piezoelectric transducers; ultrasonic imaging; ultrasonic transducers; 50 to 100 MHz; KLM model simulation; PT; PZT; PbTiO3; PbZrO3TiO3; air-loaded resonator; composition; dielectric constant; electrical impedance; electrical matching; high frequency single element imaging transducer; microstructure; piezoceramic; resonance frequency; Dielectric materials; Dielectric measurements; Electric variables measurement; Frequency measurement; Impedance measurement; Piezoelectric materials; Resonance; Thickness measurement; Titanium compounds; Transducers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1996. Proceedings., 1996 IEEE
  • Conference_Location
    San Antonio, TX
  • ISSN
    1051-0117
  • Print_ISBN
    0-7803-3615-1
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1996.584145
  • Filename
    584145