• DocumentCode
    3458697
  • Title

    An accurate threshold voltage model for nanoscale GCGS VSG MOSFET

  • Author

    Abdelmalek, N. ; Djeffal, F. ; Abdi, M.A. ; Arar, D.

  • Author_Institution
    Dept. of Electron., Univ. of Batna, Batna, Algeria
  • fYear
    2009
  • fDate
    6-8 Nov. 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, an accurate analytical threshold voltage model based on terms of surface potential is presented to study the scaling capability of nanoscale graded channel gate stack vertical surrounding gate (GCGS VSG MOSFET). Explicit approximate relations of surface potential and threshold voltage as function of device parameters are developed. The developed model is verified by its good agreement with the numerical simulations.
  • Keywords
    MOSFET; nanoelectronics; semiconductor device models; surface potential; analytical threshold voltage model; nanoscale GCGS VSG MOSFET; nanoscale graded channel gate stack MOSFET; nanoscale vertical surrounding gate MOSFET; numerical simulations; surface potential; threshold voltage; Analytical models; Circuits and systems; Doping; Leakage current; MOSFET circuits; Nanoscale devices; Poisson equations; Semiconductor process modeling; Threshold voltage; Tunneling; MOSFET; analytical model; nanoscale; threshold;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signals, Circuits and Systems (SCS), 2009 3rd International Conference on
  • Conference_Location
    Medenine
  • Print_ISBN
    978-1-4244-4397-0
  • Electronic_ISBN
    978-1-4244-4398-7
  • Type

    conf

  • DOI
    10.1109/ICSCS.2009.5412459
  • Filename
    5412459