DocumentCode :
3458902
Title :
Master timing and TOF module
Author :
Mazaheri, G.
Author_Institution :
Stanford Linear Accel. Center, Stanford Univ., CA, USA
fYear :
1991
fDate :
2-9 Nov. 1991
Firstpage :
735
Abstract :
In conjunction with the development of a beam size monitor (BSM) for the Final Focus Test Beam (FFTB), a general-purpose timing device with capabilities useful for many different applications has been built. The time master consists of a fast clock, a large memory loaded via a PC, and a time vernier (analog) with 8-b resolution. The time master generates an arbitrary pattern of pulses on 16 different channels (up to 256), with a resolution of 1/2 /sup 8/ times the clock period. The clock content is stored in another memory to measure the time of up to 16 channels, with a resolution of 1/2/sup 8/ times the clock period (frequency is set at 50 MHz), using a time-to-amplitude vernier. The data stored in the memory are accessed via a PC. The depth of the memory for pattern generation is 15 b (32767), equal to the depth of the time-measuring part. The device is self-calibrating, simply by prescribing a pattern on the output channels, and reading it into the time measuring section. The total clock length is 24 b, equivalent to 354 ms of time at 50-MHz frequency. Therefore, the resolution is on the order of 32-b (i.e., 24 b of clock plus 8 b of vernier).<>
Keywords :
nuclear electronics; particle beam diagnostics; time of flight spectrometers; timing circuits; 50 MHz; FFTB; Final Focus Test Beam; PC; TOF module; analog; arbitrary pattern; beam size monitor; clock content; fast clock; general-purpose timing device; large memory; master timing; pattern generation; resolution; self-calibrating; time master; time measuring section; time vernier; time-to-amplitude vernier; total clock length; Clocks; Counting circuits; Delay effects; Frequency; Particle beams; Pulse generation; Reflective binary codes; Testing; Time measurement; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1991., Conference Record of the 1991 IEEE
Conference_Location :
Santa Fe, NM, USA
Print_ISBN :
0-7803-0513-2
Type :
conf
DOI :
10.1109/NSSMIC.1991.259038
Filename :
259038
Link To Document :
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