DocumentCode :
3459010
Title :
A novel ESD super-clamp structure for TVS applications
Author :
Bobde, Madhur ; Mallikarjunaswamy, Shekar ; Ho, Moses ; Hebert, Francois
Author_Institution :
Alpha & Omega Semicond., Sunnyvale, CA
fYear :
2008
fDate :
24-28 Feb. 2008
Firstpage :
897
Lastpage :
900
Abstract :
This paper presents a new ESD clamp structure for transient voltage suppressor (TVS) applications that combines the advantages of avalanche diode and bipolar transistor clamps. The device structure consists of a non-snapback avalanche diode triggered vertical NPN transistor. The avalanche diode provides the fast trigger and current conduction path at low currents, while the vertical NPN bipolar transistor turn-on provides alternate low resistance path for current conduction at high currents. The snapback in the IV characteristics is minimized by matching the avalanche diode breakdown voltage VBD and the vertical NPN transistor open base collector-emitter breakdown voltage, BVCEO- Measurements on fabricated devices show consistent results with the theory. The TVS has low leakage currents (< 25 nAmps), negligible snapback in the output characteristics (<0.5 Volts) and excellent clamping voltage at high currents (13.1 Volts @ 30 Amps of TLP current). The presence of low doped base region also results in 35 % decrease in the TVS capacitance.
Keywords :
avalanche breakdown; avalanche diodes; bipolar transistors; electrostatic discharge; ESD super-clamp structure; TVS applications; avalanche diode breakdown voltage; bipolar transistor clamps; collector-emitter breakdown voltage; current conduction path; nonsnapback avalanche diode; transient voltage suppressor; triggered vertical NPN transistor; Avalanche breakdown; Bipolar transistors; Breakdown voltage; Cathodes; Circuits; Clamps; Delay; Electrostatic discharge; Protection; Semiconductor diodes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference and Exposition, 2008. APEC 2008. Twenty-Third Annual IEEE
Conference_Location :
Austin, TX
ISSN :
1048-2334
Print_ISBN :
978-1-4244-1873-2
Electronic_ISBN :
1048-2334
Type :
conf
DOI :
10.1109/APEC.2008.4522827
Filename :
4522827
Link To Document :
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