Title :
Microwave power detector based on a single MOSFET in standard technology
Author :
Ferrari, Giorgio ; Prati, Enrico ; Fumagalli, Laura ; Sampietro, Marco ; Fanciulli, Marco
Author_Institution :
Dipt. di Elettronica e Informazione, Politecnico di Milano, Italy
Abstract :
A microwave power detector based on a single metal-oxide-semiconductor field effect transistor (MOSFET) fully compatible with standard CMOS process is presented. The detector uses the nonlinearity of the channel resistance of a MOSFET operating in ohmic regime to rectify the microwave signal. A first prototype shows a sensitivity below mW and a good linearity over at least two decades of microwave power. The absence of additional technological steps required for the detector fabrication with respect to a standard CMOS process opens the realm of RF power monitoring in products at virtually no cost.
Keywords :
MOSFET; electric sensing devices; microwave field effect transistors; CMOS process; RF power monitoring; metal-oxide-semiconductor field effect transistor; microwave power detector; CMOS process; CMOS technology; Detectors; FETs; Fabrication; Linearity; MOSFET circuits; Microwave technology; Power MOSFET; Prototypes;
Conference_Titel :
Microwave Conference, 2005 European
Print_ISBN :
2-9600551-2-8
DOI :
10.1109/EUMC.2005.1610150