DocumentCode
3459057
Title
Circuit simulation model for a 100 A, 10 kV half-bridge SiC MOSFET/JBS power module
Author
Duong, T.H. ; Rivera-López, A., Jr. ; Hefner, A.R. ; Ortiz-Rodríguez, J.M.
Author_Institution
Semicond. Electron. Div., Nat. Inst. of Stand. & Technol., Gaithersburg, MD
fYear
2008
fDate
24-28 Feb. 2008
Firstpage
913
Lastpage
917
Abstract
This paper presents the simulation of a 100 A, 10 kV silicon carbide (SiC) half-bridge power module operating at 20 kHz in a behavioral boost converter circuit. In the half-bridge power module, 10 kV SiC power MOSFETs are used as the upper and lower switches, where 10 kV SiC junction barrier Schottky (JBS) anti-parallel diodes along with 100 V silicon JBS series reverse-blocking diodes are used to protect the SiC MOSFETs from reverse conduction. The behavioral boost converter is designed to operate a single power switch and a single power diode for continuous 20 kHz hard switching conditions at 5 kV and 100 A. The test circuit contains the model for the 100 A, 10 kV SiC half-bridge power module where the upper MOSFET gate is turned off. The simulated waveforms demonstrate fast switch performance (<100 ns) with minimal turn-on current spikes resulting from charging the capacitances of the other MOSFET and JBS diodes in the module. The results also indicate that the combination of the 10 kV SiC JBS anti-parallel diode with the series low-voltage silicon JBS reverse-blocking diode is effective in protecting the SiC MOSFETs from reverse conduction.
Keywords
Schottky diodes; power MOSFET; power convertors; silicon compounds; wide band gap semiconductors; JBS power module; SiC; anti-parallel diodes; behavioral boost converter circuit; circuit simulation model; current 100 A; frequency 20 kHz; half-bridge SiC MOSFET; junction barrier Schottky; minimal turn-on current spikes; reverse conduction; reverse-blocking diodes; silicon carbide; voltage 10 kV; voltage 5 kV; Circuit simulation; Circuit testing; MOSFET circuits; Multichip modules; Power MOSFET; Protection; Schottky diodes; Silicon carbide; Switches; Switching converters;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference and Exposition, 2008. APEC 2008. Twenty-Third Annual IEEE
Conference_Location
Austin, TX
ISSN
1048-2334
Print_ISBN
978-1-4244-1873-2
Electronic_ISBN
1048-2334
Type
conf
DOI
10.1109/APEC.2008.4522830
Filename
4522830
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