• DocumentCode
    3459159
  • Title

    New Method for Mixed Abnormal Pattern Recognition Using Multi-Class Support Vector Machines

  • Author

    Wu, Deihui

  • Author_Institution
    Key Lab. of Numerical Control of Jiangxi Province, Jiujiang Univ., Jiujiang, China
  • fYear
    2010
  • fDate
    21-23 Oct. 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Control charts is an important tool of statistical quality control (SQC), and the recognition of mixed abnormal pattern exists on the control chart is one of difficulties of on-line intelligent process quality diagnosis. After limitations of control chart-recognizers used in practice were analyzed, a novel intelligent process quality diagnosis method is proposed with a special model of multi-class support vector machine (MSVM). In this model, the binary decision tree is firstly used in recognizing the controlled process sample with upper on-line recognition rapidity. Then five single feature abnormal models are recognized using multi-class SVM classifiers in one-versus-one (OVO) decomposition. Finally, to make full use of the unclassifiable regions existing in the traditional "Max-Wins" voting (MWV) strategy, the capability is realized to recognize mixed abnormal patterns. Numerical results are given to demonstrate that, the proposed method can achieve the better classification ability and resolve the mixed abnormal pattern recognition problem. So, it provides a candidate for the small-batch production process quality online diagnosis and control.
  • Keywords
    control charts; decision trees; pattern classification; quality control; statistical process control; support vector machines; binary decision tree; control chart; mixed abnormal pattern recognition; multiclass support vector machine; online intelligent process quality diagnosis; statistical quality control; Artificial neural networks; Conferences; Control charts; Pattern recognition; Process control; Quality control; Support vector machines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (CCPR), 2010 Chinese Conference on
  • Conference_Location
    Chongqing
  • Print_ISBN
    978-1-4244-7209-3
  • Electronic_ISBN
    978-1-4244-7210-9
  • Type

    conf

  • DOI
    10.1109/CCPR.2010.5659303
  • Filename
    5659303