Title :
Displacement and strain imaging for an elasticity microscope
Author :
Cohn, N.A. ; Emelianov, S.Y. ; Lubinski, M.A. ; O´Donnell, M.
Author_Institution :
Dept. of Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
Abstract :
An elasticity microscope images tissue stiffness at fine resolution. We have constructed an elasticity imaging system based on a single element, 50 MHz ultrasound transducer. Displacement tracking outside of the focal region is subject to speckle decorrelation, so a multi-focus, composite B-scan image is desired. The scanning must be performed while the object is held in a static deformed position; this is accomplished by scanning the element crosswise over a narrow slit in the deforming plate. We use phase sensitive complex correlation techniques between subsequent deformations to calculate displacement and strain images both lateral and axial to the scanning plane. Experimental results from a homogeneous tissue mimicking phantom well match simulations. Results from a layered phantom demonstrate significantly higher normal axial strain in the region corresponding to the softer layer. Resolution of the strain image is 90 μm
Keywords :
acoustic correlation; acoustic microscopy; biomechanics; biomedical ultrasonics; cellular biophysics; displacement measurement; elasticity; image resolution; medical image processing; skin; speckle; strain measurement; ultrasonic focusing; 50 MHz; deforming plate; displacement imaging; displacement tracking; elasticity imaging system; elasticity microscope; fine resolution; focal region; homogeneous tissue mimicking phantom; layered phantom; multi-focus composite B-scan image; narrow slit; phase sensitive complex correlation techniques; resolution; scanning plane; single element 50 MHz ultrasound transducer; speckle decorrelation; static deformed position; strain imaging; tissue stiffness; Biomedical imaging; Capacitive sensors; Elasticity; Image resolution; Imaging phantoms; Microscopy; Speckle; Tracking; Ultrasonic imaging; Ultrasonic transducers;
Conference_Titel :
Ultrasonics Symposium, 1996. Proceedings., 1996 IEEE
Conference_Location :
San Antonio, TX
Print_ISBN :
0-7803-3615-1
DOI :
10.1109/ULTSYM.1996.584193