• DocumentCode
    3459290
  • Title

    Sub-10 picosecond differential TDR and TDT pulse source

  • Author

    Schoen, Kipp

  • Author_Institution
    Picosecond Pulse Labs. Inc., Boulder, CO, USA
  • fYear
    2003
  • fDate
    4-5 Dec. 2003
  • Firstpage
    25
  • Lastpage
    34
  • Abstract
    A 9 ps differential time domain reflectometry (TDR) and time domain transmission (TDT) source has been built and characterized. This new differential pulse source is capable of producing both positive and negative pulses for differential and common mode analysis. The module connects to a trigger source, such as a slower commercial TDR/TDT plug-in, and uses nonlinear-transmission-line (NLTL) circuits to reduce the pulse risetime. TDR pulses captured with a 70 GHz sampling plug-in have a measured risetime of approximately 12 ps and an amplitude of 200 mV. Deconvolving the effects of timing jitter and sampler risetime yields a TDR risetime of approximately 9 ps. TDR measurements of a test circuit board show two-event resolution of less than 1.5 mm. Calculations suggest a resolution limit of around 0.5 mm on alumina. TDT pulses measured with a 70 GHz sampling plug-in have a risetime of approximately 10 ps (7 ps deconvolved) with an amplitude of over 2 V. The larger pulse amplitude of the TDT signal enables improved signal margin for far-end cross talk measurements.
  • Keywords
    deconvolution; high-frequency transmission lines; millimetre wave measurement; pulse generators; time-domain reflectometry; timing jitter; 200 mV; 70 GHz; 9 ps; NLTL circuits; deconvolution; differential TDR pulse source; differential TDT pulse source; differential pulse source; nonlinear-transmission-line circuits; sampler rise-time; time domain reflectometry; time domain transmission; timing jitter; Circuit testing; Dielectric measurements; Erbium; Integrated circuit interconnections; Printed circuits; Pulse circuits; Pulse measurements; Reflectometry; Sampling methods; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Measurements Conference, 2003. Fall 2003. 62nd ARFTG
  • Print_ISBN
    0-7803-8195-5
  • Type

    conf

  • DOI
    10.1109/ARFTGF.2003.1459748
  • Filename
    1459748