Title :
Obtaining accurate IMD variation and imbalance measurements for identifying memory effects in high-power amplifiers
Author :
Mckinley, Michael D. ; Park, Yuungcheol ; Kenney, J. Stevenson ; Ku, Hyunchul
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
This paper discusses a two-tone procedure for obtaining accurate third-order intermodulation (IMD3) measurements in high-power amplifiers. Two causes of inaccuracy investigated are the amplitude flatness of the fundamental signals entering the device under test (DUT) and the IMD3 contribution of the preamp. These measurements are used to identify memory effects, indicated by IMD3 imbalances, in modules with high output powers.
Keywords :
intermodulation distortion; power amplifiers; IMD variation; IMD3 imbalance; amplitude flatness; device under test; high-power amplifiers; imbalance measurements; memory effects; signal amplitude; third-order intermodulation; two-tone procedure; Attenuators; Cables; Calibration; Distortion measurement; Electric variables measurement; Frequency; High power amplifiers; Isolators; Power amplifiers; Testing;
Conference_Titel :
Microwave Measurements Conference, 2003. Fall 2003. 62nd ARFTG
Print_ISBN :
0-7803-8195-5
DOI :
10.1109/ARFTGF.2003.1459756
