Title :
Analysis of the trade-off between input current quality and efficiency of high switching frequency PWM rectifiers
Author :
Hartmann, M. ; Kolar, J.W.
Author_Institution :
Power Electron. Syst. Lab., Swiss Fed. Inst. of Technol., Zurich, Switzerland
Abstract :
Due to their basic physical properties, power MOSFETs exhibit an output capacitance Coss that is dependent on the drain-source voltage. This (nonlinear) parasitic capacitance has to be charged at turn-off of the MOSFET by the drain-source current in rectifier applications which yields input current distortions. As a detailed analysis shows, the nonlinear behavior of this capacitance is even more pronounced for modern super junction MOSFET devices. Whereas Coss increases with increasing chip area the on-state resistance of the MOSFET decreases accordingly. Hence, a trade-off between efficiency and input current distortions exists. A detailed analysis of this effect considering different semiconductor technologies is given in this work and a Pareto curve in the η-THD space is drawn which clearly highlights this relationship. It is further shown, that the distortions mentioned can be reduced considerably by application of a proper feed-forward control signal counteracting the nonlinear switching delay due to Coss. The theoretical considerations are verified by experimental results taken from 10 kW laboratory prototypes with the switching frequencies of 250 kHz, and 1MHz.
Keywords :
MOSFET; PWM power convertors; PWM rectifiers; PWM rectifiers; Pare curve; drain-source voltage; feed-forward control signal; high switching frequency; input current quality; nonlinear switching delay; power MOSFETs; Feedforward systems; MOSFETs; Nonlinear distortion; Parasitic capacitance; Pareto analysis; Pulse width modulation; Rectifiers; Space technology; Switching frequency; Voltage; Efficiency; High frequency power converters; Input current quality; Super junction;
Conference_Titel :
Power Electronics Conference (IPEC), 2010 International
Conference_Location :
Sapporo
Print_ISBN :
978-1-4244-5394-8
DOI :
10.1109/IPEC.2010.5543283