Title :
A straight forward method of characterizing the intrinsic loss characteristics of symmetrical two port networks
Author :
Nath, Jayesh ; Steer, Michael E.
Author_Institution :
Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
Abstract :
A method for characterizing the intrinsic loss characteristics of a symmetrical two port network using a two tier calibration procedure is presented. A first tier calibration to device fixturing ports results in symmetry. The second tier calibration uses a single through line. The resulting characterization is equivalent to the transmission factor of the network with ideal input and output matching networks. This has the effect of putting two ideal matching networks at the input and output of the network. A microstrip bandpass filter measurement and characterization using this technique is presented. The results are compared with deembedded characterization obtained using the TRL calibration procedure.
Keywords :
band-pass filters; calibration; loss measurement; microstrip filters; microwave measurement; two-port networks; TRL calibration procedure; device fixturing ports; intrinsic loss characteristics; matching networks; microstrip bandpass filters; network transmission factor; symmetrical two port networks; two tier calibration procedure; Barium; Binary search trees; Calibration; Fixtures; Impedance measurement; Insertion loss; Measurement standards; Microwave devices; Microwave technology; Thin film devices;
Conference_Titel :
Microwave Measurements Conference, 2003. Fall 2003. 62nd ARFTG
Print_ISBN :
0-7803-8195-5
DOI :
10.1109/ARFTGF.2003.1459781
