DocumentCode :
3460244
Title :
SiGe power HBT design considerations for IEEE 802.11 applications
Author :
Jiang, Ningyue ; Ma, Zhenqiang ; Ma, Pingxi ; Reddy, Vijay ; Racanelli, Marco
Author_Institution :
Dept. of Electr. & Comput. Eng., Wisconsin-Madison Univ., Madison, WI, USA
Volume :
3
fYear :
2005
fDate :
4-6 Oct. 2005
Abstract :
SiGe power HBTs integrated in SiGe BiCMOS are developed and characterized at 2.4 GHz for 802.11b and 5.8 GHz for 802.11a wireless LAN applications. Design considerations of ballast resistors for SiGe power HBTs at these two frequencies are investigated for both good thermal stability and high RF power performance. The investigations show that emitter ballast resistors or base ballast resistors should be judiciously used for SiGe power HBTs operating at different frequencies in order to extract the best RF performance from these devices. An RF output power of 30.8 dBm with PAE of 50.2 % at 2.4 GHz and an output power of 27.3 dBm with PAE of 23.6 % at 5.8 GHz are achieved from single discrete SiGe power HBTs with 0.4μm in emitter width, respectively. These highest performance results demonstrate the great power amplification potential of SiGe HBTs for 802.11 wireless LAN applications.
Keywords :
BiCMOS integrated circuits; Ge-Si alloys; UHF bipolar transistors; heterojunction bipolar transistors; microwave bipolar transistors; power bipolar transistors; resistors; thermal stability; wireless LAN; 2.4 GHz; 5.8 GHz; 802.11a wireless LAN; 802.11b wireless LAN; BiCMOS technology; IEEE 802.11 wireless LAN; base ballast resistors; emitter ballast resistors; good thermal stability; high RF power performance; power HBT design; power amplification potential; BiCMOS integrated circuits; Electronic ballasts; Germanium silicon alloys; Heterojunction bipolar transistors; Power generation; Radio frequency; Resistors; Silicon germanium; Thermal resistance; Wireless LAN;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2005 European
Print_ISBN :
2-9600551-2-8
Type :
conf
DOI :
10.1109/EUMC.2005.1610218
Filename :
1610218
Link To Document :
بازگشت