DocumentCode :
3460405
Title :
10-40GHz design in SiGe-BiCMOS and Si-CMOS linking technology and circuits to maximize performance
Author :
Veenstra, H. ; Hurkx, G.A.M. ; Heijden, E. V d ; Vaucher, C.S. ; Apostolidou, M. ; Jeurissen, D. ; Deixler, P.
Author_Institution :
Philips Res. Labs., Eindhoven, Netherlands
Volume :
3
fYear :
2005
fDate :
4-6 Oct. 2005
Abstract :
This paper reviews the relevance of the widely used device metrics fT, fmax as well as the introduced device metrics fA and fcross for broadband circuit design. Usually, IC processes are benchmarked on the basis of their fT and fmax. For most circuit applications however, there is only an indirect relation between fT, fmax and circuit bandwidths. Since the differential pair amplifier is a key building block in broadband circuits, the metric fA provides a nearly direct relation to broadband circuit performance. This is demonstrated via the maximum operating frequency of a current-mode logic frequency divider, processed in 3 generations of a BiCMOS process. Metric fcross is valuable for the design of circuits employing a cross-coupled differential pair as active negative resistance, such as in LC-VCOs. The metrics can be expressed in terms of transistor parameters (e.g., Rb, Cbc, ...), allowing to derive a link between circuit performance and technology. Based on our experience, we evaluate IC processes on the basis of fT, fA and fcross rather than fT and fmax.
Keywords :
BiCMOS integrated circuits; CMOS integrated circuits; Ge-Si alloys; current-mode logic; differential amplifiers; frequency dividers; integrated circuit design; microwave integrated circuits; 10 to 40 GHz; BiCMOS technology; CMOS technology; IC process evaluation; SiGe; active negative resistance; broadband circuit design; cross-coupled differential pair; current-mode logic frequency divider; device metrics; differential pair amplifier; maximum operating frequency; Bandwidth; BiCMOS integrated circuits; Broadband amplifiers; Circuit optimization; Circuit synthesis; Differential amplifiers; Frequency conversion; Joining processes; Laboratories; Logic;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2005 European
Print_ISBN :
2-9600551-2-8
Type :
conf
DOI :
10.1109/EUMC.2005.1610228
Filename :
1610228
Link To Document :
بازگشت