Title :
Stability problems of peak current control at narrow duty cycles
Author :
Ejea-Martí, J.B. ; Sanchis-Kilders, E. ; Maset, E. ; Ferreres, A. ; Jordán, J. ; Esteve, V.
Author_Institution :
Dipt. Ing. Electron., Univ. de Valencia, Burjassot
Abstract :
An inner current loop is frequently used in many switching power supplies to achieve higher stability and a good current sharing. Nevertheless, some problems derived from its practical implementation can be encountered. One of these is related with the need of filtering of the sensed current and was suffered for the authors in the implementation of a 500 W power converter when peak current control was applied by sensing the switch current. This paper will demonstrate mathematically that an RC filter not only filters out the noise but also brings a lot of stability problems especially if duty cycle is needed to be very close to zero. The main reason for it is the severe distortion of the current waveform that results in an excessive phase loss. This phase loss is much larger than the expected from the filter itself. The problem becomes worse if we reduce the duty cycle and if we increase the load current. Then the response to the ramp of the current waveform is negligible and we have only response to a rising steep edge. This effect can lead to instabilities. This problem does not appears when it is sensed the inductor current instead of the switch current. We will also demonstrate that sensing the switch current is worse than sensing the current in the inductor from the stability point of view.
Keywords :
electric current control; filters; stability; switched mode power supplies; switching convertors; RC filter; current sharing; narrow duty cycles; peak current control; power 500 W; power converter; ramp response; stability problems; switching power supplies; Current control; Filters; Frequency modulation; Inductors; Sampling methods; Stability; Switches; Switching frequency; Transfer functions; Voltage;
Conference_Titel :
Applied Power Electronics Conference and Exposition, 2008. APEC 2008. Twenty-Third Annual IEEE
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-1873-2
Electronic_ISBN :
1048-2334
DOI :
10.1109/APEC.2008.4522931