DocumentCode
3461473
Title
Statistical runtime verification of analog and mixed signal designs
Author
Wang, Zhiwei ; Zaki, Mohamed H. ; Tahar, Sofiène
Author_Institution
Dept. ECE, Concordia Univ., Montreal, QC, Canada
fYear
2009
fDate
6-8 Nov. 2009
Firstpage
1
Lastpage
6
Abstract
One of the challenges for the verification of analog and mixed signal (AMS) designs is the stochastic behavior associated. In this paper, we propose a runtime verification approach to verify the statistical property of the AMS design. The methodology is based on the combination of the statistical method and Mont Carlo simulation. The verification procedure produces confidence level and error margin that provide the tolerance and accuracy for the verification results. We apply the proposed methodology to study the jitter property of a PLL design.
Keywords
Monte Carlo methods; integrated circuit design; jitter; mixed analogue-digital integrated circuits; phase locked loops; statistical analysis; stochastic processes; AMS design; Monte Carlo simulation; PLL; analog and mixed signal designs; confidence level; error margin; jitter; statistical runtime verification; stochastic behavior; Circuit simulation; Circuits and systems; Electronics industry; Formal specifications; Monitoring; Runtime; Signal design; Statistical analysis; Stochastic processes; Stochastic resonance;
fLanguage
English
Publisher
ieee
Conference_Titel
Signals, Circuits and Systems (SCS), 2009 3rd International Conference on
Conference_Location
Medenine
Print_ISBN
978-1-4244-4397-0
Electronic_ISBN
978-1-4244-4398-7
Type
conf
DOI
10.1109/ICSCS.2009.5412620
Filename
5412620
Link To Document