• DocumentCode
    3461610
  • Title

    Monte Carlo optimization of depth-of-interaction resolution in PET crystals

  • Author

    DeVol, T.A. ; Moses, W.W. ; Derenzo, S.E.

  • Author_Institution
    Dept. of Nucl. Eng., Michigan Univ., Ann Arbor, MI, USA
  • fYear
    1991
  • fDate
    2-9 Nov. 1991
  • Firstpage
    1618
  • Abstract
    The light distribution along one edge of a positron emission tomography (PET) scintillation crystal was investigated with a Monte Carlo simulation. This position-dependent light can be used to measure the 511-keV photon interaction position in the crystal on an event-by-event basis, thus reducing radial elongation. The expectant full width at half maximum (FWHM) of the light distribution on the 3-mm*30-mm surface of a 3-mm*10-mm*30-mm bismuth germanate (BGO) crystal surrounded by a diffuse reflector was determined to be 3.0 mm. This light distribution does not change as the width (originally 3 mm) is varied from 1 to 6 mm, but decreases monotonically from 3.0 to 1.8 mm FWHM as the height (originally 10 mm) is reduced to 3 mm. Other geometrical modifications were simulated, including numerous corner reflectors on the opposing 3-mm *30-mm surface, which reduced the FWHM to 2.4 mm. The response of a dual-wedge photodiode combined with the predicted light distribution for the 3-mm*10-mm*30-mm BGO scintillation crystal results in an expected depth of interaction resolution of 7.5 mm FWHM.<>
  • Keywords
    Monte Carlo methods; computerised tomography; optimisation; radioisotope scanning and imaging; 1 to 30 mm; PET crystals; depth-of-interaction resolution; dual-wedge photodiode; full width at half maximum; light distribution; medical diagnostic imaging; nuclear medicine; radial elongation; Assembly; Bismuth; Detectors; Laboratories; Monte Carlo methods; Photodiodes; Photonic crystals; Position measurement; Positron emission tomography; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference, 1991., Conference Record of the 1991 IEEE
  • Conference_Location
    Santa Fe, NM, USA
  • Print_ISBN
    0-7803-0513-2
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1991.259188
  • Filename
    259188