Title :
Source equalization for SPUDT transducers
Author :
Dufilié, Pierre ; Ventura, Pascal
Author_Institution :
Thomson Components & Tubes Corp., Vernon, CT, USA
Abstract :
The electroacoustic source strength for a periodic SAW transducer can be determined analytically. With the exception of sources close to the ends of the transducer, the source strength function does not depend on its position in the transducer. A Distributed Acoustic Reflection Transducer (DART) is not periodic and consists of two or more linewidths and strip periods. The source strength and effective source position of a strip is dependent on the widths and positions of the adjacent strips. Strips of a given width can exhibit source strength differences of 10% or more depending on their position in the DART. This paper presents two methods for predicting the source strength and effective position of a source in a DART. The first method uses an electrostatic Green´s function analysis. The second more complete method uses a mixed FEM/BEM analysis to obtain a more accurate result. Results of these two methods are compared for various transducer configurations. Using the above results a 112 MHz filter was designed and built on a 112°YX LiTaO 3 substrate
Keywords :
Green´s function methods; VHF filters; acoustic wave reflection; boundary-elements methods; finite element analysis; surface acoustic wave filters; surface acoustic wave transducers; ultrasonic transducers; 112 MHz; DART; DART filter design; LiTaO3; LiTaO3 substrate; SPUDT transducers; distributed acoustic reflection transducer; effective source position; electroacoustic source strength; electrostatic Green´s function analysis; mixed FEM/BEM analysis; periodic SAW transducer; source equalization; source strength function; strip periods; transducer configurations; Acoustic measurements; Acoustic reflection; Acoustic transducers; Computer simulation; Electrostatic analysis; Filters; Geometry; Green´s function methods; Strips; Surface acoustic waves;
Conference_Titel :
Ultrasonics Symposium, 1995. Proceedings., 1995 IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-2940-6
DOI :
10.1109/ULTSYM.1995.495532