• DocumentCode
    3462329
  • Title

    Development of nanometer scale temperature measurement method with polarized near-field light

  • Author

    Hosaka, Sumio ; Nitta, Jumpei ; Taguchi, Yasuhiro ; Nagasaka, Y. ; Saiki, T.

  • Author_Institution
    Sch. of Integrated Design Eng., Keio Univ., Yokohama, Japan
  • fYear
    2011
  • fDate
    8-11 Aug. 2011
  • Firstpage
    59
  • Lastpage
    60
  • Abstract
    We report on the development of a temperature measurement method at the nanoscale using polarized near-field light. In this method, temperature measurement is accomplished by detecting the near-field polarization change in illumination-collection mode operation.
  • Keywords
    light polarisation; nanophotonics; temperature measurement; illumination-collection mode operation; nanometer scale temperature measurement; polarized near-field light; Laser beams; Measurement by laser beam; Polarization; Refractive index; Sensitivity; Spatial resolution; Temperature measurement; Near-field optics; Polarization; Thermometry;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optical MEMS and Nanophotonics (OMN), 2011 International Conference on
  • Conference_Location
    Istanbul
  • ISSN
    2160-5033
  • Print_ISBN
    978-1-4577-0334-8
  • Type

    conf

  • DOI
    10.1109/OMEMS.2011.6031103
  • Filename
    6031103
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3462329