DocumentCode :
3462628
Title :
Two-point correlation as a feature for histology images: Feature space structure and correlation updating
Author :
Cooper, Lee ; Saltz, Joel ; Machiraju, Raghu ; Huang, Kun
Author_Institution :
Center for Comprehensive Inf., Emory Univ., Atlanta, GA, USA
fYear :
2010
fDate :
13-18 June 2010
Firstpage :
79
Lastpage :
86
Abstract :
The segmentation of tissues in whole-slide histology images is a necessary step for the morphological analyses of tissues and cellular structures. Previous works have demonstrated the potential of two-point correlation functions (TPCF) as features for tissue segmentation, however the feature space is not yet well understood and computational methods are lacking. This paper illustrates several fundamental aspects of TPCF feature space and contributes a fast algorithm for deterministic feature computation. Despite the high-dimensionality of TPCF feature space, the features corresponding to different tissues are shown to be characterized by low-dimensional manifolds. The relationship between TPCF and the familiar co-occurrence matrix is highlighted, and it is shown that costly cross correlations are not necessary to achieve an accurate segmentation. For computation, the method of correlation updating, based on the linearity of the correlation operator, is proposed and shown to achieve up to a 67X speedup over frequency domain computation methods. Segmentation results are demonstrated on multiple tissues and natural texture images.
Keywords :
biological tissues; biology computing; correlation methods; feature extraction; image segmentation; image texture; TPCF feature space; co-occurrence matrix; feature space structure; histology images; morphological analyses; tissue segmentation; two-point correlation; Biomedical informatics; Biomedical measurements; Extracellular; Frequency domain analysis; Gabor filters; Image analysis; Image segmentation; Linearity; Nuclear measurements; Sampling methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition Workshops (CVPRW), 2010 IEEE Computer Society Conference on
Conference_Location :
San Francisco, CA
ISSN :
2160-7508
Print_ISBN :
978-1-4244-7029-7
Type :
conf
DOI :
10.1109/CVPRW.2010.5543453
Filename :
5543453
Link To Document :
بازگشت