DocumentCode :
3463313
Title :
Sampling measurements of low-frequency waveforms based on the Josephson voltage standard
Author :
Kim, Mun-Seog ; Kim, Kyu-Tae ; Kim, Wan-Seop ; Chong, Yonuk ; Kwon, Sung-Won
Author_Institution :
Korea Res. Inst. of Stand. & Sci., Daejeon, South Korea
fYear :
2010
fDate :
13-18 June 2010
Firstpage :
179
Lastpage :
180
Abstract :
A waveform synthesizer adopting a superconductor-normal metal-superconductor junction array has been developed, which can generate arbitrary stepwise waveforms with a number of the quantum-voltage steps up to 1-V level amplitude. As an application of the synthesizer, we have built a sampling voltmeter which measures the differential voltages between a sinusoidal waveform produced by a semiconductor-based ac source and the Josephson waveforms. We carried out extensive sampling measurements for a 50-Hz sine wave with 1-V amplitude, applying various sampling apertures.
Keywords :
Josephson effect; frequency standards; signal sampling; superconducting arrays; superconductor-normal-superconductor devices; voltage measurement; voltmeters; waveform generators; I-V amplitude; Josephson voltage standard; arbitrary stepwise waveform genneration; frequency 50 Hz; frequency measurement; quantum voltage steps; sampling voltmeter; superconductor- normal metal-superconductor junction array; waveform synthesizer; Apertures; Distortion measurement; Electromagnetic measurements; Josephson junctions; Measurement standards; Sampling methods; Standards development; Synthesizers; Voltage; Voltmeters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-6795-2
Type :
conf
DOI :
10.1109/CPEM.2010.5543494
Filename :
5543494
Link To Document :
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