• DocumentCode
    3463507
  • Title

    Voltage disturbance generator with phase jump for the test of microgrid

  • Author

    Nho, Eui-Cheol ; Jung, Jae-Hun ; Kim, In-Dong ; Chun, Tae-Won ; Kim, Heung-Geun ; Choi, Nam-Sup ; Choi, Jaeho

  • Author_Institution
    Dept. of Electr. Eng., Pukyong Nat. Univ., Busan, South Korea
  • fYear
    2010
  • fDate
    21-24 June 2010
  • Firstpage
    487
  • Lastpage
    491
  • Abstract
    A voltage disturbance generator for the test of a microgrid is described. The generator provides the function of voltage sag, unbalance, outage, and phase jump of the output voltage. The proposed generator has good features of high reliability, low cost, simple structure, high efficiency, and easy implementation. The main components of the generator are SCR thyristors and transformers, which provides reliable system. The circuit analysis and operating principle of the proposed scheme are described in each operating mode. The characteristics of the voltage and current in each mode are analyzed, and the usefulness of the scheme is verified through simulations.
  • Keywords
    power supply quality; microgrid; phase jump; voltage disturbance generator; voltage sag; Testing; Voltage; Miocrogrid; Phase-angle jump; Power quality; STS; Voltage sag;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Conference (IPEC), 2010 International
  • Conference_Location
    Sapporo
  • Print_ISBN
    978-1-4244-5394-8
  • Type

    conf

  • DOI
    10.1109/IPEC.2010.5543505
  • Filename
    5543505