DocumentCode
3463507
Title
Voltage disturbance generator with phase jump for the test of microgrid
Author
Nho, Eui-Cheol ; Jung, Jae-Hun ; Kim, In-Dong ; Chun, Tae-Won ; Kim, Heung-Geun ; Choi, Nam-Sup ; Choi, Jaeho
Author_Institution
Dept. of Electr. Eng., Pukyong Nat. Univ., Busan, South Korea
fYear
2010
fDate
21-24 June 2010
Firstpage
487
Lastpage
491
Abstract
A voltage disturbance generator for the test of a microgrid is described. The generator provides the function of voltage sag, unbalance, outage, and phase jump of the output voltage. The proposed generator has good features of high reliability, low cost, simple structure, high efficiency, and easy implementation. The main components of the generator are SCR thyristors and transformers, which provides reliable system. The circuit analysis and operating principle of the proposed scheme are described in each operating mode. The characteristics of the voltage and current in each mode are analyzed, and the usefulness of the scheme is verified through simulations.
Keywords
power supply quality; microgrid; phase jump; voltage disturbance generator; voltage sag; Testing; Voltage; Miocrogrid; Phase-angle jump; Power quality; STS; Voltage sag;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics Conference (IPEC), 2010 International
Conference_Location
Sapporo
Print_ISBN
978-1-4244-5394-8
Type
conf
DOI
10.1109/IPEC.2010.5543505
Filename
5543505
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