Design of dual-duplex system and evaluation of RAM

Author

Kim, Hyunki ; Lee, Jungsuk ; Lee, Keyseo ; Lee, Hyuntae

Author_Institution

Motorola Korea Design Center, Seoul, South Korea

fYear

2001

fDate

2001

Firstpage

710

Lastpage

715

Abstract

We develop the dual-duplex system that detects a fault using a hardware comparator which switches to a hot standby redundancy. This system is designed on the basis of MC68000 and can be used in VMEbus. To improve the reliability and safety, the dual-duplex system is designed in double modular redundancy. The failure rate of the electrical element is calculated in MILSPEC-217F by RELEX6.0 tool, and the system RAMS (reliability, availability, maintainability, safety) and MTTF (mean time to failure) are designed by Markov modeling and evaluated by Matlab. Since the dual-duplex system has high reliability, availability, and safety, it can be applied to embedded control systems like airplanes and high-speed railway systems

Keywords

Markov processes; fault tolerant computing; reliability theory; safety; software reliability; traffic engineering computing; MC68000; MILSPEC-217F; Markov modeling; RELEX 6 tool; availability; dual-duplex system; fault-tolerance; maintainability; mean time to failure; reliability; safety; stand-by system; Air safety; Availability; Electrical fault detection; Electrical safety; Hardware; Maintenance; Mathematical model; Railway safety; Redundancy; Switches;

fLanguage

English

Publisher

ieee

Conference_Titel

Intelligent Transportation Systems, 2001. Proceedings. 2001 IEEE

Conference_Location

Oakland, CA

Print_ISBN

0-7803-7194-1

Type

conf

DOI

10.1109/ITSC.2001.948747

Filename

948747