• DocumentCode
    3463543
  • Title

    Excitation of ultrasonic Lamb waves in composite membranes

  • Author

    Joshi, S.G. ; Jin, Y.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Marquette Univ., Milwaukee, WI, USA
  • Volume
    1
  • fYear
    1995
  • fDate
    7-10 Nov 1995
  • Firstpage
    429
  • Abstract
    The excitation of ultrasonic Lamb waves by an interdigital transducer in a composite plate consisting of a piezoelectric thin film deposited on a nonpiezoelectric membrane is analyzed using the Green´s function method. The amplitudes of the generated waves are obtained in terms of the charge density on transducer electrodes. An electrostatic analysis that neglects piezoelectric coupling is used to relate this charge density to the voltage applied across the IDT. This is then used to calculate the input characteristics of the IDT. The characteristics of Lamb wave devices fabricated on a zinc oxide-on-silicon nitride membrane are measured and compared with theoretical calculations. It is shown that strong internal reflections are inherently present in an IDT fabricated on thin plates. A knowledge of these is essential in order to correctly calculate the characteristics of the IDT. It appears that the internal reflections can be utilized to realize unidirectional transducers for Lamb waves
  • Keywords
    Green´s function methods; interdigital transducers; piezoelectric thin films; surface acoustic wave transducers; ultrasonic transducer arrays; Green´s function method; ZnO-Si3N4; charge density; composite membranes; electrostatic analysis; interdigital transducer; piezoelectric thin film; strong internal reflections; transducer electrodes; ultrasonic Lamb waves; unidirectional transducers; Biomembranes; Electrodes; Electrostatic analysis; Green´s function methods; Piezoelectric films; Piezoelectric transducers; Reflection; Ultrasonic transducers; Voltage; Zinc;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1995. Proceedings., 1995 IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    1051-0117
  • Print_ISBN
    0-7803-2940-6
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1995.495614
  • Filename
    495614