DocumentCode
3463578
Title
Revised Visual Assessment of (Cluster) Tendency (reVAT)
Author
Huband, J.M. ; Bezdek, J.C. ; Hathaway, R.J.
Author_Institution
Dept. of Comput. Sci., Univ. of West Florida, Pensacola, FL, USA
Volume
1
fYear
2004
fDate
27-30 June 2004
Firstpage
101
Abstract
The Visual Assessment of (cluster) Tendency (VAT) method readily displays cluster tendency for small data sets as grayscale images, but is too computationally costly for larger data sets. A revised version of VAT is presented here that can efficiently be applied to larger collections of data. A numerical example is included.
Keywords
computational complexity; graph theory; pattern clustering; statistical analysis; cluster tendency; computational complexity; graph theory; grayscale images; larger data sets; small data sets; visual assessment; Computer displays; Computer science; Digital images; Equations; Gray-scale; Image generation; Pixel; Roentgenium; Scattering; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Fuzzy Information, 2004. Processing NAFIPS '04. IEEE Annual Meeting of the
Print_ISBN
0-7803-8376-1
Type
conf
DOI
10.1109/NAFIPS.2004.1336257
Filename
1336257
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