DocumentCode

3464065

Title

Embedded & Graphics DRAMs

Author

Sato, Katsuyuki ; Choi, Joo Sun

Author_Institution

TSMC, Hsinchu, Taiwan

fYear

2008

fDate

3-7 Feb. 2008

Firstpage

268

Lastpage

269

Keywords

Bandwidth; Clocks; Costs; Error correction codes; Graphics; Logic; Random access memory; Research and development; Sun; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference, 2008. ISSCC 2008. Digest of Technical Papers. IEEE International

Conference_Location

San Francisco, CA

Print_ISBN

978-1-4244-2010-0

Electronic_ISBN

978-1-4244-2011-7

Type

conf

DOI

10.1109/ISSCC.2008.4523160

Filename

4523160