Title :
Evaluation of planar and trench IGBT for hard- and soft-switching performance
Author :
Trivedi, Malay ; Shenai, Krishna
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Illinois Univ., Chicago, IL, USA
Abstract :
This paper presents a comparison of planar and trench IGBT in hard and soft-switching applications. Higher carrier density in trench IGBTs results in smaller cell size and improved conduction. It is shown that this increase in the concentration of excess charges also results in inferior turn-off performance. Hard-switching performance is dominated by turnoff losses. The trench IGBT under study has higher switching losses than identically rated planar IGBT. Soft switching results in significant reduction of the turn-off stress; thus promising an increase in switching frequency till the device becomes the limiting factor once again. High switching losses of trench IGBTs may be a setback from this consideration even as conduction performance of the device improves significantly. It is also shown that electrothermal consideration can significantly limit the short circuit withstanding capability of trench IGBTs in comparison with planar IGBT
Keywords :
carrier density; insulated gate bipolar transistors; isolation technology; losses; power semiconductor switches; short-circuit currents; carrier density; conduction improvement; conduction performance; excess charges concentration; hard-switching performance; inferior turn-off performance; planar IGBT; short circuit withstanding capability; soft-switching performance; trench IGBT; turnoff losses; Application software; Circuits; Current density; Insulated gate bipolar transistors; Performance loss; Semiconductor optical amplifiers; Stress; Switches; Switching loss; Voltage;
Conference_Titel :
Industry Applications Conference, 1999. Thirty-Fourth IAS Annual Meeting. Conference Record of the 1999 IEEE
Conference_Location :
Phoenix, AZ
Print_ISBN :
0-7803-5589-X
DOI :
10.1109/IAS.1999.800028