• DocumentCode
    3464296
  • Title

    Work function tunability by incorporating lanthanum and aluminum into refractory metal nitrides and a feasible integration process

  • Author

    Wang, Xin Peng ; Li, Ming-Fu ; Yu, H.Y. ; Ren, C. ; Loh, W.-Y. ; Zhu, C.X. ; Chin, Albert ; Trigg, A.D. ; Yeo, Yee-Chi A. ; Biesemans, S. ; Lo, G.Q. ; Kwong, D.L.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., National Univ. of Singapore
  • fYear
    2006
  • fDate
    Oct. 2006
  • Firstpage
    424
  • Lastpage
    426
  • Abstract
    In this work, lanthanum-incorporated refractory metal nitride is investigated as an n-type metal gate electrode with tunable work function. By adding La into HfN metal gate deposited on SiO2 gate dielectric, its gate work function can be tuned from 4.6 eV to 3.9 eV continuously by changing La composition. The authors also report the effective work function of TaN can be tuned to p-type with the incorporation of Al based on our findings, we propose a feasible integration process for dual metal gate CMOS technology
  • Keywords
    CMOS integrated circuits; aluminium; dielectric materials; electrodes; hafnium compounds; lanthanum; refractories; silicon compounds; tantalum compounds; work function; 3.9 to 4.6 eV; Al; CMOS technology; HfN; La; SiO2; TaN; gate work function; metal gate electrode; Aluminum; Annealing; CMOS process; CMOS technology; Capacitance-voltage characteristics; Electrodes; High K dielectric materials; High-K gate dielectrics; Lanthanum; Thermal stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0160-7
  • Electronic_ISBN
    1-4244-0161-5
  • Type

    conf

  • DOI
    10.1109/ICSICT.2006.306268
  • Filename
    4098125