DocumentCode
3464296
Title
Work function tunability by incorporating lanthanum and aluminum into refractory metal nitrides and a feasible integration process
Author
Wang, Xin Peng ; Li, Ming-Fu ; Yu, H.Y. ; Ren, C. ; Loh, W.-Y. ; Zhu, C.X. ; Chin, Albert ; Trigg, A.D. ; Yeo, Yee-Chi A. ; Biesemans, S. ; Lo, G.Q. ; Kwong, D.L.
Author_Institution
Dept. of Electr. & Comput. Eng., National Univ. of Singapore
fYear
2006
fDate
Oct. 2006
Firstpage
424
Lastpage
426
Abstract
In this work, lanthanum-incorporated refractory metal nitride is investigated as an n-type metal gate electrode with tunable work function. By adding La into HfN metal gate deposited on SiO2 gate dielectric, its gate work function can be tuned from 4.6 eV to 3.9 eV continuously by changing La composition. The authors also report the effective work function of TaN can be tuned to p-type with the incorporation of Al based on our findings, we propose a feasible integration process for dual metal gate CMOS technology
Keywords
CMOS integrated circuits; aluminium; dielectric materials; electrodes; hafnium compounds; lanthanum; refractories; silicon compounds; tantalum compounds; work function; 3.9 to 4.6 eV; Al; CMOS technology; HfN; La; SiO2; TaN; gate work function; metal gate electrode; Aluminum; Annealing; CMOS process; CMOS technology; Capacitance-voltage characteristics; Electrodes; High K dielectric materials; High-K gate dielectrics; Lanthanum; Thermal stability;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
Conference_Location
Shanghai
Print_ISBN
1-4244-0160-7
Electronic_ISBN
1-4244-0161-5
Type
conf
DOI
10.1109/ICSICT.2006.306268
Filename
4098125
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