DocumentCode :
3464331
Title :
How TOC & TPM work together to build the quality toolbox of SDWTs
Author :
Rose, Ed ; Odom, Ray ; Dunbar, Randy ; Hinchman, Jim
Author_Institution :
Harris Semicond., USA
fYear :
1995
fDate :
2-4 Oct 1995
Firstpage :
56
Lastpage :
59
Abstract :
This paper details activities targeted at improving task behaviors within self-directed work teams (SDWTs), which subsequently improve productivity and quality within the factory. Like many companies, Harris Semiconductor manages its resources to improve productivity and lower manufacturing costs. One major initiative employed at Harris, Theory of Constraints (TOC), focuses on increased throughput, decreased inventory, and reduced operating expense. TOC is the central focus for individual, team, and equipment improvements. Employees are involved in continuous improvement activities, Total Productive Maintenance (TPM) and system improvement project teams to achieve TOC objectives. We focus on the methods used at Harris Semiconductor to deploy and train employees in TOC and TPM, a subset of the total employee “tool box” needed to be successful in today´s very competitive environment
Keywords :
constraint handling; constraint theory; economics; human resource management; integrated circuit manufacture; quality control; training; Harris Semiconductor; TOC; TPM; continuous improvement activities; employee training; inventory; manufacturing costs; operating expense; productivity; quality improvement; quality toolbox; resource management; self-directed work teams; theory of constraints; throughput; total productive maintenance; Constraint theory; Continuous improvement; Costs; Delay; Distributed Bragg reflectors; Face; Financial management; Human resource management; Investments; Pipelines; Production facilities; Productivity; Quality management; Resource management; Semiconductor device manufacture; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1995. 'Manufacturing Technologies - Present and Future', Seventeenth IEEE/CPMT International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-2996-1
Type :
conf
DOI :
10.1109/IEMT.1995.526092
Filename :
526092
Link To Document :
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