DocumentCode
3464448
Title
Mixed-signal circuit testing-A review
Author
Wey, Chin-Long
Author_Institution
Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA
Volume
2
fYear
1996
fDate
13-16 Oct 1996
Firstpage
1064
Abstract
Testing and fault diagnosis are two important aspects in the design and maintenance of mixed-signal circuits. To enhance testability and fault diagnosability, both design-for-testability (DFT) and built-in self-test (BIST) techniques have been successfully developed for digital circuits. This paper reviews the development of these techniques in analog circuits and discusses the future challenges in both fault diagnosis and testing
Keywords
automatic testing; built-in self test; design for testability; fault diagnosis; integrated circuit testing; mixed analogue-digital integrated circuits; reviews; BIST; DFT; IC testing; built-in self-test; design-for-testability; fault diagnosis; mixed-signal circuit testing; review; Analog circuits; Automatic testing; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Costs; Fault diagnosis; Integrated circuit technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics, Circuits, and Systems, 1996. ICECS '96., Proceedings of the Third IEEE International Conference on
Conference_Location
Rodos
Print_ISBN
0-7803-3650-X
Type
conf
DOI
10.1109/ICECS.1996.584604
Filename
584604
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